Автор туралы ақпарат
Астафьев, С. Б.
| Шығарылым | Бөлім | Атауы | Файл |
| Том 69, № 3 (2024) | ПОВЕРХНОСТЬ, ТОНКИЕ ПЛЕНКИ | Determination of the structure of weakly ordered films according to x-ray diffraction data | |
| Том 68, № 1 (2023) | ПОВЕРХНОСТЬ, ТОНКИЕ ПЛЕНКИ | FEATURES OF THE APPLICATION OF MATHEMATICAL OPTIMIZATION METHODS FOR THE STUDY OF NANOSTRUCTURES BASED ON X-RAY DIFFRACTION DATA |