Author Details
Gorlov, M. I
| Issue | Section | Title | File |
| No 6 (2024) | Electromagnetic methods | TESTING SEMICONDUCTOR PRODUCTS USING LOW-FREQUENCY NOISE PARAMETERS |
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Keywords
Full Matrix Capture (FMC)
Total Focusing Method (TFM)
acoustic anisotropy
acoustic emission
antenna array
bending stiffness
coercive force
defect
eddy current testing
flaw detection
image processing
infrared thermography
metallography
non-destructive testing
nondestructive testing
standing waves
thermal testing
thermography
ultrasonic inspection
ultrasonic testing
ultrasound
Information
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User
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Login to verify subscription
Keywords
Full Matrix Capture (FMC)
Total Focusing Method (TFM)
acoustic anisotropy
acoustic emission
antenna array
bending stiffness
coercive force
defect
eddy current testing
flaw detection
image processing
infrared thermography
metallography
non-destructive testing
nondestructive testing
standing waves
thermal testing
thermography
ultrasonic inspection
ultrasonic testing
ultrasound
Information