Structure and Morphology of the Tungsten-Based Material of the First Wall of the Tokamak Divertor Before and After Irradiation with Hydrogen Plasma
- Authors: Polyakov D.D.1,2, Voronin A.V.1, Nashchekin A.V.1, Levin A.A.1
-
Affiliations:
- Ioffe Institute
- LETI Saint Petersburg Electrotechnical University
- Issue: No 2 (2025)
- Pages: 101-118
- Section: Articles
- URL: https://clinpractice.ru/1028-0960/article/view/686837
- DOI: https://doi.org/10.31857/S1028096025020133
- EDN: https://elibrary.ru/EIJZRE
- ID: 686837
Cite item
Abstract
The results of a study of the microstructure and structure of plates made of tungsten metal powder (group of companies “Specmetalmaster”, GC “SMM”) used as protective tiles in the lower divertor of the tokamak Globus-M and subjected to additional treatment with hydrogen plasma of a coaxial accelerator from distances of 50 and 260 mm at 5, 10 and 20 irradiation cycles are presented. The microstructure and elemental composition of the plate surface were determined by scanning electron microscopy and energy dispersive X-ray spectroscopy, respectively. The microstructure of the irradiated surface layer of the plates at a penetration depth of X-rays up to ~1.4 μm was analyzed from X-ray diffraction data using graphical methods of Williamson–Hall plot and crystallite size — microstrain plot adapted to take into account the observed pseudo-Voigt type of X-ray reflections. The structure of this layer was refined using the Rietveld method. The asymmetry of tungsten (W) reflections after plasma treatment was described by a model with 2 (for samples irradiated from a distance of 260 mm) and 3 (for a distance of 50 mm) crystalline W phases of the same cubic symmetry, but with slightly different parameters of the cubic unit cell and with different values of the mean size of crystallites and the absolute value of mean microstrain in them.
Full Text

About the authors
D. D. Polyakov
Ioffe Institute; LETI Saint Petersburg Electrotechnical University
Author for correspondence.
Email: aleksandr.a.levin@mail.ioffe.ru
Russian Federation, Saint Petersburg; Saint Petersburg
A. V. Voronin
Ioffe Institute
Email: aleksandr.a.levin@mail.ioffe.ru
Russian Federation, Saint Petersburg
A. V. Nashchekin
Ioffe Institute
Email: aleksandr.a.levin@mail.ioffe.ru
Russian Federation, Saint Petersburg
A. A. Levin
Ioffe Institute
Email: aleksandr.a.levin@mail.ioffe.ru
Russian Federation, Saint Petersburg
References
- Будаев В.П. // ВАНТ. Сер. Термоядерный синтез. 2015. Т. 38. № 4. С. 5. https://www.doi.org/10.21517/0202-3822-2015-38-4-5-33
- Воронин А.В., Александров А.Е., Бер Б.Я., Брунков П.Н., Борматов A.A., Гусев В.К., Демина Е.В., Новохацкий A.Н., Павлов С.И., Прусакова М.Д., Сотникова Г.Ю., Яговкина М.А. // ЖТФ. 2016. Т. 86. № 3. С. 51.
- Seyedhabashi M.M., Tafreshi M.A., Bidabadi B.S., Shafiei S., Abdisaray A. // Appl. Radiat. Isot. 2019. V. 154. P. 108875. https://www.doi.org/10.1016/j.apradiso.2019.108875
- Bhuyan M., Mohanty S.R., Rao C.V.S., Rayjada P.A., Raole P.M. // Appl. Surf. Sci. 2013. V. 264. P. 674. https://www.doi.org/10.1016/j.apsusc.2012.10.093
- Parish C.M., Wang K., Doerner R.P., Baldwin M.J. // Scr. Mater. 2017. V. 127. P. 132. https://www.doi.org/10.1016/j.scriptamat.2016.09.018
- Javadi S., Ouyang B., Zhang Z., Ghoranneviss M., Elahi A.S., Rawat R.S. // Appl. Surf. Sci. 2018. V. 443. P. 311. https://www.doi.org/10.1016/j.apsusc.2018.03.039
- Makhlaj V.A., Garkusha I.E., Malykhin S.V., Pugachov A.T., Landman I., Linke J., Pestchanyi S., Chebotarev V.V., Tereshin V.I. // Phys. Scr. 2009. V. 2009. № T138. P. 014060. https://www.doi.org/10.1088/0031-8949/2009/T138/014060
- Makhlaj V.A., Garkusha I.E., Linke J., Malykhin S.V., Aksenov N.N., Byrka O.V., Herashchenko S.S., Surovitskiy S.V., Wirtz M. // Nucl. Mat. Energ. 2016. V. 9. P. 116. https://www.doi.org/10.1016/j.nme.2016.04.001
- Арутюнян З.Р., Огородникова О.В., Аксенова А.С., Гаспарян Ю.М., Ефимов В.С., Харьков М.М., Казиев А.В., Волков Н.В. // Поверхность. Рентген. cинхротр. нейтрон. исслед. 2020. Т. 12. № 12. С. 21. https://www.doi.org/10.31857/S1028096020120067
- Wang K., Doerner R.P., Baldwin M.J., Meyer F.W., Bannister M.E., Darbal A., Stroud R., Parish C.M. // Sci. Rep. 2017. V. 7. № 42315. P. 1. https://www.doi.org/10.1038/srep42315
- Kozushkina A., Pavlov S.I., Voronin A.V., Sokolov R.V., Levin A.A. // J. Phys.: Conf. Ser. 2020. V. 1697. P. 01234. https://www.doi.org/10.1088/1742-6596/1697/1/012134
- Herashchenko S.S., Girka O.I., Surovitskiy S.V., Makhlai V.A., Malykhin S.V., Myroshnyk M.O., Bizyukov I.O., Aksenov N.N., Borisova S.S., Bizyukov O.A., Garkusha I.E. // Nucl. Instr. Meth. B. 2019. V. 440. P. 82. https://www.doi.org/10.1016/j.nimb.2018.12.010
- Tokitani M., Miyamoto M., Masuzaki S., Hatano Y., Lee S.E., Oya Y., Otsuka T., Oyaidzu M., Kurotaki H., Suzuki T., Hamaguchi D., Hayashi T., Asakura N., Widdowson A., Jachmich S., Rubel M. // Phys. Scr. 2020. V. 2020. № T171. P. 014010. https://www.doi.org/10.1088/1402-4896/ab3d09
- Zhao C., Chen Y., Song J., Mei X., Pan Q., Zhang R., Yang L., Zhao F., Li J., Wang D. // Plasma Phys. Control. Fusion. 2023. V. 65. № 1. P. 015012. https://www.doi.org/10.1088/1361-6587/aca4f6
- Guo W., Wang S., Xu K., Zhu Y., Wang X.-X., Cheng L., Yuan Y., Fu E., Guo L., De Temmerman G., Lu G.-H. // Phys. Scr. 2020. V. 2020. № T171. 014004. https://www.doi.org/10.1088/1402-4896/ab36d8
- Gago M., Kreter A., Unterberg B., Wirtz M. // Phys. Scr. 2020. V. 2020. № T171. P. 014007. https://www.doi.org/10.1088/1402-4896/ab3bd9
- Kengesbekov A., Rakhdilov B., Satbaeva Z. Investigation of Microstructure and Mechanical Properties of Tungsten Irradiated by Helium Plasma. Preprint 2023111205. 2023. https://www.doi.org/10.20944/preprints202311.1205.v1
- Khan A., de Temmerman G., Kajita S., Greuner H., Balden M., Hunger K., Ohno N., Hwangbo D., Tomita Y., Tokitani M., Nagata D., Yajima M. // Phys. Scr. 2020. № T171. P. 014050. https://www.doi.org/10.1088/1402-4896/ab52c6
- Гусев В.К., Голант В.Е., Гусаков Е.З., Дьяченко В.В., Ирзак М.А., Минаев В.Б., Мухин Е.Е., Новохацкий А.Н., Подушникова К.А., Раздобарин Г.Т., Сахаров Н.В., Трегубова Е.Н., Узлов В.С., Щербинин О.Н., Беляков В.А., Кавин А.А., Косцов Ю.А., Кузьмин Е.Г., Сойкин В.Ф., Кузнецов Е.А., Ягнов В.А. // ЖТФ. 1999. Т. 69. № 9. С. 58.
- DIFFRAC.EVA. (2024) Software for the analysis of 1D and 2D X-ray datasets including visualization, data reduction, phase identification and quantification, statistical evaluation. Bruker AXS. Karlsruhe. Germany. https://www.bruker.com/ru/products-and-solutions/diffractometers-and-x-ray-microscopes/x-ray-diffractometers/diffrac-suite-software/diffrac-eva.htm. Cited 5 Juni 2024
- International Centre for Diffraction Data (ICDD). Powder Diffraction File-2 (2014) Newton Square, PA, USA. https://www.icdd.com/. Cited 5 Juni 2024
- Maunders C., Etheridge J., Wright N., Whitfield H.J. // Acta. Crystallogr. B. 2005. V. 61. № 1. 154. https://www.doi.org/10.1107/S0108768105001667
- Terlan B., Levin A.A., Börrnert F., Simon F., Oschatz M., Schmidt M., Cardoso-Gil R., Lorenz T., Baburin I.A., Joswig J.-O., Eychmüller A. // Chem. Mater. 2015. V. 27. № 14. P. 5106. https://www.doi.org/10.1021/acs.chemmater.5b01
- Terlan B., Levin A.A., Börrnert F., Zeisner J., Kataev V., Schmidt M., Eychmüller A. // Eur. J. Inorg. Chem. 2016. V. 6. № 21. P. 3460. https://www.doi.org/10.1002/ejic.201600315
- Langford J.I., Cernik R.J., Louer D. // J. Appl. Crystallogr. 1991. V. 24. № 5. P. 913. https://www.doi.org/10.1107/S0021889891004375
- Levin A.A. Program SizeCr for calculation of the microstructure parameters from X-ray diffraction data. 2022. https://www.doi.org/10.13140/RG.2.2.15922.89280
- Rehani B.R., Joshi P.B., Lad K.N., Pratap A. // Indian J. Pure Appl. Phys. 2006. V. 44. № 2. P. 157.
- Scherrer P. // Nachr. Kӧnigl. Ges. Wiss. Gӧttingen. 1918. B. 26. S. 98.
- Stokes A.R., Wilson A.J.C. // Proc. Phys. Soc. London. 1944. V. 56. № 3. P. 174. https://www.doi.org/10.1088/0959-5309/56/3/303
- Coelho A.A. // J. Appl. Crystallogr. 2018. V. 51. P. 210. https://www.doi.org/10.1107/S1600576718000183
- Berger H. // X-ray Spectrom. 1986. V. 15. № 4. P. 241. https://www.doi.org/10.1002/xrs.1300150405
- Pitschke W., Hermann H., Mattern N. // Powder Diffr. 1993. V. 8. № 2, P. 74. https://www.doi.org/10.1017/S0885715600017875
- Rietveld H.M. // Z. Kristallogr. 2010. B. 225. № 12. S. 545. https://www.doi.org/10.1524/zkri.2010.1356
- Dubrovinsky L.S., Saxena S.K. // Phys. Chem. Miner. 1997. V. 24. № 8. P. 547. https://www.doi.org/10.1007/s002690050070
- Dollase W.A. // J. Appl. Crystallogr. 1986. V. 19. № 4. P. 267. https://www.doi.org/10.1107/S0021889886089458
- Järvinen M. // J. Appl. Crystallogr. 1993. V. 26. № 4. P. 525. https://www.doi.org/10.1107/S0021889893001219
- Cheary R.W., Coelho A.A. // J. Appl. Crystallogr. 1992. V. 25. № 2. P. 109. https://www.doi.org/10.1107/S0021889891010804
- Balzar D., Voigt-function model in diffraction line-broadening analysis. // Defect and Microstructure Analysis by Diffraction. / Ed. Snyder R.L., Fiala J., Bunge H.J. Oxford: IUCr, Oxford Uni. Press, 1999. P. 94.
- Balashova E., Levin A.A., Fokin A., Redkov A., Krichevtsov B. // Crystals. 2021. V. 11. № 11. P. 1278. https://www.doi.org/10.3390/cryst11111278
- Bérar J.-F., Lelann P.J. // J. Appl. Crystallogr. 1991. V. 24. № 1. P. 1. https://www.doi.org/10.1107/S0021889890008391
- Andreev Yu.G. // J. Appl. Crystallogr. 1994. V. 27. № 2. P. 288. https://www.doi.org/10.1107/S002188989300891X
- Levin A.A. Program RietESD for correction of estimated standard deviations obtained in Rietveld-refinement programs. 2022. https://www.doi.org/10.13140/RG.2.2.10562.04800
- Narykova M.V., Levin A.A., Prasolov N.D., Lihachev A.I., Kardashev B.K., Kadomtsev A.G., Panfilov A.G., Sokolov R.V., Brunkov P.N., Sultanov M.M., Kuryanov V.N., Tyshkevich V.N. // Crystals. 2022. V. 12. № 2. P. 166. https://www.doi.org/10.3390/cryst12020166
- Hill R.J., Fischer R.X. // J. Appl. Crystallogr. 1990. V. 23. № 5. P. 462. https://www.doi.org/10.1107/S0021889890006094
- Pecharsky V.K., Zavalij P.Y. Preferred orientation. // Fundamentals of Powder Diffraction and Structural Characterization of Materials. 2nd edition. New York, USA: Springer Science+Business Media LLC, 2009. P. 194.
Supplementary files
